+1
Завершен

Pattern Feature

Graham_Sam 10 лет назад в Metrology Software / PC-DMIS • обновлен Neil Challinor 1 месяц назад • 2

We would like to be able to pattern around a specified feature as oppose to having to move the datum to that location, as pattern only operates around the datum.

This is a good idea, Graham, that we also heard from the recent UK SMA Days. Thanks for filing. Let's see who else would find this useful.

Завершен

This functionality was added in PC-DMIS 2021.1 - see "Centre of Rotation" on the Pattern Setup - Alignment Tab page of the help file.

Сервис поддержки клиентов работает на платформе UserEcho