Ideas
+1
COMPLETADO
Pattern Feature
Graham_Sam hace 10 años
en Metrology Software / PC-DMIS
•
actualizado por Neil Challinor hace 1 mes •
2
We would like to be able to pattern around a specified feature as oppose to having to move the datum to that location, as pattern only operates around the datum.
Servicio de atención al cliente por UserEcho
This is a good idea, Graham, that we also heard from the recent UK SMA Days. Thanks for filing. Let's see who else would find this useful.
This functionality was added in PC-DMIS 2021.1 - see "Centre of Rotation" on the Pattern Setup - Alignment Tab page of the help file.