الأفكار
+1
تم الإنجاز
Pattern Feature
Graham_Sam منذ 10 سنة
في Metrology Software / PC-DMIS
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تم التحديث من قبل Neil Challinor منذ 1 شهر •
2
We would like to be able to pattern around a specified feature as oppose to having to move the datum to that location, as pattern only operates around the datum.
خدمة دعم العملاء من خلال UserEcho
This is a good idea, Graham, that we also heard from the recent UK SMA Days. Thanks for filing. Let's see who else would find this useful.
This functionality was added in PC-DMIS 2021.1 - see "Centre of Rotation" on the Pattern Setup - Alignment Tab page of the help file.