+1
Completed

Pattern Feature

Graham_Sam 10 years ago in Metrology Software / PC-DMIS updated by Neil Challinor 2 weeks ago 2

We would like to be able to pattern around a specified feature as oppose to having to move the datum to that location, as pattern only operates around the datum.

This is a good idea, Graham, that we also heard from the recent UK SMA Days. Thanks for filing. Let's see who else would find this useful.

Completed

This functionality was added in PC-DMIS 2021.1 - see "Centre of Rotation" on the Pattern Setup - Alignment Tab page of the help file.