+1
Terminé

Pattern Feature

Graham_Sam il y a 10 ans dans Metrology Software / PC-DMIS • mis à jour par Neil Challinor il y a 1 mois • 2

We would like to be able to pattern around a specified feature as oppose to having to move the datum to that location, as pattern only operates around the datum.

This is a good idea, Graham, that we also heard from the recent UK SMA Days. Thanks for filing. Let's see who else would find this useful.

Terminé

This functionality was added in PC-DMIS 2021.1 - see "Centre of Rotation" on the Pattern Setup - Alignment Tab page of the help file.