Currently the way PC-DMIS is if you are using a Precitec type controller for a CWLS system in order to correct the range on the controller for the current lens of use you have to go in EGON Configuration editor (which you should not do unless you really know what you are doing! but I had to) to change the WLS Lens selection.

There is no option to change this within the laser parameters while coding or anywhere in PC-DMIS. This is currently solely controlled by hard code from the configuration. I have 3 different white light sensor lens and in order to change out one to another I have to open EGON every time.

Please add a Forum section for Chromatic White Light Sensor Scanning or laser scanning to share discussions upon using a third probe setup on machines. This would be a huge imporvement.

I cannot find anny topics or discussions on this topic it is fairly new and would be a great addition.

I wish I could insert created views in legacy report. Now I can only recall views and make a screenshot of screen and this is not automated. Creation of complete legacy report take too much time but creating views is simple and faster. Legacy report is saved as PDF document.

a quicker more accessible option for reporting

We would like to be able to pattern around a specified feature as oppose to having to move the datum to that location, as pattern only operates around the datum.

Want to be able to report proper GD&T when using looping to palletize parts

Allow users to reverse the order in "Relative to:" dropdown lists, so user can easily assign the relativity to previous (or near) feature.

Allow subsampling (e.g.) of data points for feature extraction in "Filters" - plane and feature separately

Similarly to center-based features, allow extraction to result in evaluating highest point from selected set. It would be welcome also for cylinder extraction (Including MIN/Best-Fit/MAX)

The Other windows| Settings window, should show whether fastprobemode is on or off.