Bring back the summary mode of 2020 R2. You can keep the color scheme you have if you want. But not being able to hover the dimensions and seeing the results is very annoying. What even is the point of summary mode now??

Allow a simple solution for creating auto features that per the current ASME standard are selected as continuous features (CF). I would recommend adding a CF button within the feature edit window to allow you to select the required features as well as a hotkey. To make it easier for the user the software should recognize what features are continuous.

This will help simplify the path optimization for Auto Features. Example: If you are measuring a continuous plane that has many interruptions you can now globally adjust the parameters and you don't have to construct a scan of all the individual features. 

This would also be a good move since the popular metrology software Zone3 already has the ability to select multiple CAD surfaces as a CF.

It is also possible to click on individual points and have the deviation displayed directly in the report.

Add an option to make the probe transparent in setup for all of your programs. This could also apply to other lighting settings as well.

I'd like to be able to enable and disable clip planes within a program so that I can take live snapshots of profiles in the middle of parts without having to keep clip planes on at all times.  This could be added in to the viewset feature as well.

在2018版本甚至以前的版本 替换元素名称可以在概要模式下进行，并且替换名称之后测量误差还在。更新2022和2023以后替换元素名称不能在概要模式下进行了，即便更换为命令模式替换元素名称之后 误差值不在了。

As a programmer, I would appreciate the ability to work with Sample Hits from Auto Features in the new versions.

In the picture is an example of usage.

I need to use at least three Sample Hits to measure the hole precisely. 

Then I have to measure the contact surface around the hole, e.g. as an Auto Feature "Auto Plane" using "Relative to" to this hole.

If there was a possibility to use Sample Hits in the construction, I would measure the hole with using more Sample Hits which I would then use to construct the contact area around the hole and I would save one feature measurement in the program, which itself is not much, but if you have e.g. ten such holes on the part, it already saves some time spent on the 3D machine, which is very welcome in serial production.

When entering a new simultaneous tolerance command, there is a "smart" filter in which dimensions that don't share the same datum reference frame as the first selected dimension will be removed from the list. The filtering seems to be based on the datum letter(s) itself and not the actual datum features used within the DATDEF command.

Example: A part is measured, flipped halfway through, and measurement is finished. In both orientations, the same datum feature was measured (measured twice). When creating dimensions, DATDEF commands are inserted at the appropriate location, redefining the datum required for measurement (datum feature pre-flip, datum feature post-flip). The Simultaneous Tolerance command will show all of the dimensions in the dialog window after auto-filtering, but selecting all the dimensions will result in an error "Simultaneous tolerances must have identical datum reference frames." because the datum features are technically different in each dimension (pre-flip vs post-flip).

Please investigate the feasibility of changing the filtering rules of the Simultaneous Tolerance command by looking at the actual features used in the DATDEF command, and not just the letter(s) assigned.

Thank you.